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Output factor measurement in high dose-per-pulse IORT electron beams

TitoloOutput factor measurement in high dose-per-pulse IORT electron beams
Tipo di pubblicazioneArticolo su Rivista peer-reviewed
Anno di Pubblicazione2019
AutoriPimpinella, M., Andreoli S., De Angelis C., S. Monaca Della, D'Arienzo M., and Menegotti L.
RivistaPhysica Medica
Volume61
Paginazione94-102
ISSN11201797
Parole chiavearticle, controlled study, dosimetry, Electric potential, electron beam, intraoperative radiotherapy, radiological procedures, reproducibility, silicon
Abstract

Purpose: To assess the capability of different types of detectors to measure relative output factors (OF) at high dose per pulse by comparison with alanine dosimeters, which are independent of dose rate. Methods: Measurements were made in 9 MeV and 7 MeV electron beams produced by a Novac7 accelerator for intraoperative radiotherapy. Applicators with diameter of 10-7-6-5 and 4 cm were used. The dose per pulse varied from about 30 mGy, for the 10 cm reference applicator, to about 70 mGy, for the 4 cm applicator. Five types of plane-parallel ionization chambers (PTW Advanced Markus, Markus and Roos, IBA PPC40 and PPC05), two types of silicon diodes (PTW 60017 and IBA EFD3G) and a PTW 60019 microDiamond were considered. For the ionization chambers, correction factors for ion recombination effects were determined for each applicator using a modified two-voltage-analysis method that includes the free-electron component. Results: Reference OF values were determined by alanine dosimeters with a standard combined uncertainty of 0.8%. Deviations from the reference OFs were generally within 1.5% for all the detectors, hence within the 95% confidence interval of alanine measurements. Larger deviations of up to about 2% obtained in a few cases are consistent with a 0.7% long-term reproducibility of OF measurements. Conclusions: Comparison with alanine measurements demonstrated that all the detectors considered in this work can be used to measure OFs in high dose-per-pulse electron beams with an accuracy better than 2%, provided that appropriate corrections for ion recombination effects are applied when using ionization chambers. © 2019 Associazione Italiana di Fisica Medica

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85064946922&doi=10.1016%2fj.ejmp.2019.04.021&partnerID=40&md5=b5f9a33c0a60a35c1e0e095f276519c8
DOI10.1016/j.ejmp.2019.04.021
Citation KeyPimpinella201994